A Note on Exponential Decay in the Random Field Ising Model

Research output: Contribution to journalArticle

Abstract

For the two-dimensional random field Ising model (RFIM) with bimodal (i.e., two-valued) external field, we prove exponential decay of correlations either (i) when the temperature is larger than the critical temperature of the Ising model without external field and the magnetic field strength is small or (ii) at any temperature when the magnetic field strength is sufficiently large. Unlike previous work on exponential decay, our approach is not based on cluster expansions but rather on arguably simpler methods; these combine an analysis of the Kertész line and a coupling of Ising measures (and also their random cluster representations) with different boundary conditions. We also show similar but weaker results for the RFIM with a general field distribution and in any dimension.

Original languageEnglish (US)
Pages (from-to)268-284
Number of pages17
JournalJournal of Statistical Physics
Volume173
Issue number2
DOIs
StatePublished - Oct 1 2018

Fingerprint

Exponential Decay
Random Field
Ising model
Ising Model
External Field
field strength
decay
Magnetic Field
Cluster Expansion
Decay of Correlations
Valued Fields
Bimodal
Critical Temperature
magnetic fields
Ising
critical temperature
boundary conditions
Boundary conditions
expansion
temperature

Keywords

  • Coupling
  • Exponential decay
  • Kertész line
  • Random cluster model
  • Random field Ising model

ASJC Scopus subject areas

  • Statistical and Nonlinear Physics
  • Mathematical Physics

Cite this

A Note on Exponential Decay in the Random Field Ising Model. / Camia, Federico; Jiang, Jianping; Newman, Charles.

In: Journal of Statistical Physics, Vol. 173, No. 2, 01.10.2018, p. 268-284.

Research output: Contribution to journalArticle

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