A hazard-free majority voter for tmr-based fault tolerance in asynchronous circuits

Sobeeh Almukhaizim, Ozgur Sinanoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Triple-Modular Redundancy (TMR) is the simplest and most effective fault tolerant design method for ICs, where three copies of a given circuit are employed and a majority voter produces the voted output. Asynchronous circuits, however, exhibit various characteristics that limit the applicability of TMR on such designs. Specifically, the difficulty stems from the fact that asynchronous circuits communicate with their environment through hazard-free output transitions. This hazard-free property needs to be preserved when hardware providing fault tolerance is added. Therefore, performing TMR-based fault tolerance in asynchronous circuits requires the development of a hazard-free majority voter. In this work, we first demonstrate how and why a typical majority voter design would fail to preserve the hazard-free property of its response when a transient error occurs at one of its inputs. We then propose a novel hazard-free majority voter design for the TMR-based fault tolerant method. Finally, using PSpice simulations, we verify the effectiveness of the proposed voter design in preserving the hazard-free property of the response of an asynchronous circuit, and we assess its area overhead over that of a typical majority voter.

Original languageEnglish (US)
Title of host publicationProceedings - IDT'07 The 2nd International Design and Test Workshop
Pages93-98
Number of pages6
DOIs
StatePublished - Dec 1 2007
Event2nd international Design and Test Workshop, IDT 2007 - Cairo, Egypt
Duration: Dec 16 2007Dec 18 2007

Other

Other2nd international Design and Test Workshop, IDT 2007
CountryEgypt
CityCairo
Period12/16/0712/18/07

Fingerprint

fault tolerance
Fault tolerance
hazards
Hazards
redundancy
Redundancy
Networks (circuits)
output
stems
preserving
hardware
Hardware

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Almukhaizim, S., & Sinanoglu, O. (2007). A hazard-free majority voter for tmr-based fault tolerance in asynchronous circuits. In Proceedings - IDT'07 The 2nd International Design and Test Workshop (pp. 93-98). [4437437] https://doi.org/10.1109/IDT.2007.4437437

A hazard-free majority voter for tmr-based fault tolerance in asynchronous circuits. / Almukhaizim, Sobeeh; Sinanoglu, Ozgur.

Proceedings - IDT'07 The 2nd International Design and Test Workshop. 2007. p. 93-98 4437437.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Almukhaizim, S & Sinanoglu, O 2007, A hazard-free majority voter for tmr-based fault tolerance in asynchronous circuits. in Proceedings - IDT'07 The 2nd International Design and Test Workshop., 4437437, pp. 93-98, 2nd international Design and Test Workshop, IDT 2007, Cairo, Egypt, 12/16/07. https://doi.org/10.1109/IDT.2007.4437437
Almukhaizim S, Sinanoglu O. A hazard-free majority voter for tmr-based fault tolerance in asynchronous circuits. In Proceedings - IDT'07 The 2nd International Design and Test Workshop. 2007. p. 93-98. 4437437 https://doi.org/10.1109/IDT.2007.4437437
Almukhaizim, Sobeeh ; Sinanoglu, Ozgur. / A hazard-free majority voter for tmr-based fault tolerance in asynchronous circuits. Proceedings - IDT'07 The 2nd International Design and Test Workshop. 2007. pp. 93-98
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