A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications

Samah Mohamed Saeed, Ozgur Sinanoglu

Research output: Contribution to journalArticle

Abstract

Editor's note: Testability is a perennial concern that requires ever-improved solutions; however, potentially resultant security vulnerabilities need to be considered as well. This article provides a compact look at a body of DfT work from lead practitioners in the field. The DfT strategies address predicting and controlling test data volume and reducing power. Potential impacts of DfT to security are considered, along with strategies for providing testability without sacrificing security.

Original languageEnglish (US)
Article number7403884
Pages (from-to)57-64
Number of pages8
JournalIEEE Design and Test
Volume34
Issue number1
DOIs
StatePublished - Feb 1 2017

Keywords

  • Design-for-testability
  • Hardware security
  • Low power test
  • Scan attack
  • Scan attack

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications. / Saeed, Samah Mohamed; Sinanoglu, Ozgur.

In: IEEE Design and Test, Vol. 34, No. 1, 7403884, 01.02.2017, p. 57-64.

Research output: Contribution to journalArticle

@article{3f180f9a42dc4bef8a1ac7f8027ce940,
title = "A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications",
abstract = "Editor's note: Testability is a perennial concern that requires ever-improved solutions; however, potentially resultant security vulnerabilities need to be considered as well. This article provides a compact look at a body of DfT work from lead practitioners in the field. The DfT strategies address predicting and controlling test data volume and reducing power. Potential impacts of DfT to security are considered, along with strategies for providing testability without sacrificing security.",
keywords = "Design-for-testability, Hardware security, Low power test, Scan attack, Scan attack",
author = "Saeed, {Samah Mohamed} and Ozgur Sinanoglu",
year = "2017",
month = "2",
day = "1",
doi = "10.1109/MDAT.2016.2527708",
language = "English (US)",
volume = "34",
pages = "57--64",
journal = "IEEE Design and Test",
issn = "2168-2356",
publisher = "IEEE Computer Society",
number = "1",

}

TY - JOUR

T1 - A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications

AU - Saeed, Samah Mohamed

AU - Sinanoglu, Ozgur

PY - 2017/2/1

Y1 - 2017/2/1

N2 - Editor's note: Testability is a perennial concern that requires ever-improved solutions; however, potentially resultant security vulnerabilities need to be considered as well. This article provides a compact look at a body of DfT work from lead practitioners in the field. The DfT strategies address predicting and controlling test data volume and reducing power. Potential impacts of DfT to security are considered, along with strategies for providing testability without sacrificing security.

AB - Editor's note: Testability is a perennial concern that requires ever-improved solutions; however, potentially resultant security vulnerabilities need to be considered as well. This article provides a compact look at a body of DfT work from lead practitioners in the field. The DfT strategies address predicting and controlling test data volume and reducing power. Potential impacts of DfT to security are considered, along with strategies for providing testability without sacrificing security.

KW - Design-for-testability

KW - Hardware security

KW - Low power test

KW - Scan attack

KW - Scan attack

UR - http://www.scopus.com/inward/record.url?scp=85009998050&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85009998050&partnerID=8YFLogxK

U2 - 10.1109/MDAT.2016.2527708

DO - 10.1109/MDAT.2016.2527708

M3 - Article

AN - SCOPUS:85009998050

VL - 34

SP - 57

EP - 64

JO - IEEE Design and Test

JF - IEEE Design and Test

SN - 2168-2356

IS - 1

M1 - 7403884

ER -