A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications

Samah Mohamed Saeed, Ozgur Sinanoglu

    Research output: Contribution to journalArticle

    Abstract

    Editor's note: Testability is a perennial concern that requires ever-improved solutions; however, potentially resultant security vulnerabilities need to be considered as well. This article provides a compact look at a body of DfT work from lead practitioners in the field. The DfT strategies address predicting and controlling test data volume and reducing power. Potential impacts of DfT to security are considered, along with strategies for providing testability without sacrificing security.

    Original languageEnglish (US)
    Article number7403884
    Pages (from-to)57-64
    Number of pages8
    JournalIEEE Design and Test
    Volume34
    Issue number1
    DOIs
    StatePublished - Feb 1 2017

    Keywords

    • Design-for-testability
    • Hardware security
    • Low power test
    • Scan attack
    • Scan attack

    ASJC Scopus subject areas

    • Software
    • Hardware and Architecture
    • Electrical and Electronic Engineering

    Cite this

    A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications. / Saeed, Samah Mohamed; Sinanoglu, Ozgur.

    In: IEEE Design and Test, Vol. 34, No. 1, 7403884, 01.02.2017, p. 57-64.

    Research output: Contribution to journalArticle

    Saeed, Samah Mohamed ; Sinanoglu, Ozgur. / A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications. In: IEEE Design and Test. 2017 ; Vol. 34, No. 1. pp. 57-64.
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